TERGHINI, W. et al.
 MEASUREMENT AND ANALYSIS OF I-V-T CHARACTERISTICS OF A AUGENI/P-SI SCHOTTKY BARRIER DIODE.
<strong>Courrier du Savoir</strong>, [S.l.], v. 19, mars 2015.
ISSN 1112-3338.
Disponible à l'adresse&nbsp;: &gt;<a href="https://revues.univ-biskra.dz./index.php/cds/article/view/1204" target="_new">https://revues.univ-biskra.dz./index.php/cds/article/view/1204</a>&gt;. Date de consultation&nbsp;: 14 nov. 2024